Data sample screening and reconstruction method in high nickel matte flotation process modeling
A technology of flotation process and data samples, applied in the direction of neural architecture, complex mathematical operations, biological neural network models, etc., can solve data modeling and other problems, and achieve the effect of improving flotation grade and yield
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2022-01-28
Abstract
Description
technical field
[0001] The invention relates to the technical field of high-nickel matte flotation process data modeling, and more specifically relates to the technical field of data sample screening and reconstruction methods in high-nickel matte flotation process modeling. Background technique
[0002] The high nickel matte flotation process is an important step in the nickel smelting process, the purpose is to further separate the nickel-copper artificial ore after pyroprocessing. The complexity of the high-nickel-sulfur flotation process has led to the fact that no accurate analytical model can be used to guide production. In order to improve the flotation grade and yield, it is necessary to model the flotation process, and use the model to guide production and optimize it.
[0003] Because of the complexity of the actual flotation process, the modeling method can only use the data-based modeling method, and because there is a large time lag between the system parameter...
Examples
Embodiment
[0022] This embodiment provides a data sample screening and reconstruction method in the modeling of high-nickel matte flotation process, including the following steps:
[0023] Step 1: According to the actual situation of the high-nickel matte flotation process, determine the lag time length of each individual flotation column parameter change affecting the final grade, select the system lag parameter p, and perform data reorganization according to this parameter;
[0024] Step 2: The system lag parameter p is a parameter including time redundancy obtained during the system analysis process. In order to reduce the calculation scale and improve the modeling calculation efficiency, the system lag parameter p is used as the maximum lag time allowed by the system, starting from zero According to a certain time interval, multiple different values are taken as the system lag time, and modeling is carried out separately. The optimal system lag time is selected based on the model ac...